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5¿ù 13-14ÀÏ: JEOL Users Meeting
5¿ù 14ÀÏ 12:00-13:00 Âü°¡µî·Ï
13:00-13:20 °³È¸½Ä
13:20-15:20 Ưº°°¿¬
15:20-16:00 Ưº°È¸¿ø Àü½Ã ¹× Æ÷½ºÅÍ ¹ßÇ¥ Åä·Ð
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17:00-18:00 ÀÓ½ÃÃÑȸ
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5¿ù 15ÀÏ 09:30-10:30 Ưº°È¸¿ø ¹ßÇ¥
10:30-11:10 Ưº°°¿¬
11:20-12:00 ȸ¿ø±³À°
12:00-13:30 Á¡½É
13:30-16:00 ÀϹݿ¬Á¦
16:00 Æóȸ
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1. ¿À»óÈ£ ¹Ú»ç (KBSI): Geometric confinement effects on dislocation plasticity studied by in-situ TEM straining of FIB-machined submicron crystals
2. ÀüâÁø ±³¼ö (°æºÏ´ëÇб³): Application of confocal microscope for the analyses of neurochemical specific neural circuits and cell density
3. ±èÁ¤¿ë ±³¼ö (ÀÎõ´ëÇб³): ³ª³ë°øÃÊÁ¡Çö¹Ì°æ±â¼úÀÇ °³¹ß°ú ÀÀ¿ë
4. À庴¼ö ±³¼ö (ÇѼ´ëÇб³): ÀüÀÚÇö¹Ì°æÀ» Ȱ¿ëÇÑ ¹Ì¶ó ¿¬±¸
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1. À¯ÀÓÁÖ ±³¼ö (°í·Á´ëÇб³, ÇÐȸ ÆíÁýÀÌ»ç): ³í¹®ÃâÆÇÀÇ À±¸®Àû Ãø¸é °íÂû°ú °¡À̵å¶óÀÎ
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1. William Bill Thompson (Carl Zeiss): The helium ion microscope for high resolution imaging, materials analysis, and materials modification
2. ±èÇöÈ (AP Tech/ FEI Company): Extreme high-resolution SEM at low kV
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