Á¦40Â÷ (2009³â) Ãá°èÇмú´ëȸ ÀÏÁ¤ °øÁö °ü¸®ÀÚ

2009³â Á¦40Â÷ Ãá°èÇмú´ëȸ ÀÏÁ¤ÀÌ È®Á¤µÇ¾ú½À´Ï´Ù. ÀÚ¼¼ÇÑ ÀÏÁ¤Àº ÷ºÎ¹®¼­¸¦ È®ÀÎÇÏ¿© Áֽñ⠹ٶø´Ï´Ù.

 

ÀϽÃ: 2009³â 5¿ù 13ÀÏ - 15ÀÏ

Àå¼Ò: ÇѾç´ëÇб³ ¾È»êÄ·ÆÛ½º °Ô½ºÆ®ÇϿ콺 3Ãþ ÄÁº¥¼ÇȦ

 

ÁÖ¿ä ÀÏÁ¤:

5¿ù 13-14ÀÏ: JEOL Users Meeting

5¿ù 14ÀÏ 12:00-13:00 Âü°¡µî·Ï

                 13:00-13:20 °³È¸½Ä

                 13:20-15:20 Ưº°°­¿¬

                 15:20-16:00 Ưº°È¸¿ø Àü½Ã ¹× Æ÷½ºÅÍ ¹ßÇ¥ Åä·Ð

                 16:00-17:00 ÀϹݿ¬Á¦

                 17:00-18:00 ÀÓ½ÃÃÑȸ

                 18:00-          °£Ä£È¸

5¿ù 15ÀÏ  09:30-10:30 Ưº°È¸¿ø ¹ßÇ¥

                 10:30-11:10 Ưº°°­¿¬

                 11:20-12:00 ȸ¿ø±³À°

                 12:00-13:30 Á¡½É

                 13:30-16:00 ÀϹݿ¬Á¦

                 16:00            Æóȸ

* Ưº°È¸¿ø Àü½Ã´Â 5¿ù 14ÀÏ 13:00-18:00, 5¿ù 15ÀÏ 09:30-16:00±îÁö ÁøÇàµË´Ï´Ù.

 

* Ưº°°­¿¬ ÁÖÁ¦

 1. ¿À»óÈ£ ¹Ú»ç (KBSI): Geometric confinement effects on dislocation plasticity studied by in-situ TEM straining of FIB-machined submicron crystals

2. ÀüâÁø ±³¼ö (°æºÏ´ëÇб³): Application of confocal microscope for the analyses of neurochemical specific neural circuits and cell density

3. ±èÁ¤¿ë ±³¼ö (ÀÎõ´ëÇб³): ³ª³ë°øÃÊÁ¡Çö¹Ì°æ±â¼úÀÇ °³¹ß°ú ÀÀ¿ë

4. À庴¼ö ±³¼ö (ÇѼ­´ëÇб³): ÀüÀÚÇö¹Ì°æÀ» Ȱ¿ëÇÑ ¹Ì¶ó ¿¬±¸

 

* ȸ¿ø±³À° ÁÖÁ¦

1. À¯ÀÓÁÖ ±³¼ö (°í·Á´ëÇб³, ÇÐȸ ÆíÁýÀÌ»ç): ³í¹®ÃâÆÇÀÇ À±¸®Àû Ãø¸é °íÂû°ú °¡À̵å¶óÀÎ

 

* Ưº°È¸¿ø ¹ßÇ¥ ÁÖÁ¦

1. William Bill Thompson (Carl Zeiss): The helium ion microscope for high resolution imaging, materials analysis, and materials modification

2. ±èÇöÈ­ (AP Tech/ FEI Company): Extreme high-resolution SEM at low kV

 

                

÷ºÎÆÄÀÏ :  09Ãá°èÇö¹Ì°æÇÐȸÀÏÁ¤_ÃÖÁ¾.pdf 09Ãá°èÇö¹Ì°æÇÐȸÀÏÁ¤_ÃÖÁ¾°ø°í.pdf